The low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer scale objects: application to carbon nanotubes

摘要

We have developed a simple and reliable technique for two-terminal transportmeasurements of free-standing wire-like objects. The method is based on thelow-energy electron point source microscope. The field emission tip of themicroscope is used as a movable electrode to make a well-defined localelectrical contact on a controlled place of a nanometer-size object. Thisallows transport measurements of the object to be conducted. The technique wasapplied to carbon nanotube ropes.